Thermal impedance extraction for bipolar transistors

IEEE Transactions on Electron Devices

Volumn 43, Issue 2, 1996, Pages 342-346

  Zweidinger, David T ^a   Fox, Robert M ^a   Brodsky, Jonathan S ^a   Jung, Taewon ^b   Lee, Sang Gug ^c  

^a University of Florida   (United States)

^b INTERSIL CORPORATION   (United States)

^c Handong University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; ELECTRIC CURRENTS; POWER CONTROL; SEMICONDUCTOR DEVICE MODELS; STEP RESPONSE; TEMPERATURE MEASUREMENT; THERMAL EFFECTS; THERMODYNAMIC PROPERTIES; THERMOMETERS;

CIRCUIT MODELLING; FRACTIONAL TEMPERATURE COEFFICIENTS; TEMPERATURE DEPENDENCE; THERMAL IMPEDANCE EXTRACTION; TRANSIENT STEP RESPONSE;

BIPOLAR TRANSISTORS;

EID: 0030085690     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.481737     Document Type: Article

References (9)

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2. P. C. Munro and F.-Q. Ye, "Simulating the current mirror with a selfheating BJT model," IEEE J. Solid-State Circ., pp. 1321-1324, Sept. 1991.
3. C. C. McAndrew, "A complete and consistent electrical/thermal HBT model," in BCTM '92, pp. 200-203, Oct. 1992.
4. G.-B. Gao, M.-Z. Wang, X. Gui. and H. Morko, "Thermal design studies of high-power heterojunction bipolar transistors," IEEE Trans. Electron Devices, vol. 36, no. 5, pp. 854-863, 1989.
5. R. M. Fox, S.-G. Lee, and D. T. Zweidinger, "The effects of BJT selfheating on circuit behavior," IEEE J. Solid-State Circ., vol. 28, no. 6, pp. 678-685, 1993.
6. M. Reisch, "Self-heating in BJT circuit parameter extraction," SolidState Electron., vol. 35, no. 5, pp. 677-679, 1992.
7. R. M. Fox and S.-G. Lee, "Thermal parameter extraction for bipolar circuit modeling," Electron. Lett., vol. 27, no. 19, pp. 1719-1720, 1991.
8. J. S. Brodsky, D. T. Zwcidinger, and R. M. Fox, "Physics-based multiple-pole models for BJT self-heating," in BCTM Proc., pp. 249-25 2, 1993.
9. J. S. Brodsky, "TIPP: Thermal impedance pre-processor," User's Reference, Univ. of Fla. Dept. of ECE, Technical Report, 1995.