The interstitial C A defect in bulk Si and Si1-xGex

Journal of Physics Condensed Matter

Volumn 16, Issue 47, 2004, Pages 8545-8555

  Hao, Shiqiang ^a   Kantorovich, Lev ^a   Davies, Gordon ^a  

^a KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DATA REDUCTION; ELECTRONIC STRUCTURE; FREQUENCIES; IMPURITIES; OPTOELECTRONIC DEVICES; PHONONS; SPECTRUM ANALYSIS;

EXPERIMENTAL DATA; GAP STATE; OPTICAL ENERGIES; PHONON SPECTRA;

SILICON;

EID: 10344263393     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/47/008     Document Type: Article

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