메뉴 건너뛰기




Volumn 306, Issue 5703, 2004, Pages 1910-1913

Observation of the spin hall effect in semiconductors

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; GALLIUM COMPOUNDS; HALL EFFECT; MAGNETIC FIELDS; MICROSCOPIC EXAMINATION; POLARIZATION;

EID: 10344244030     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1105514     Document Type: Article
Times cited : (2638)

References (29)
  • 2
    • 0003920493 scopus 로고    scopus 로고
    • Institute of Physics, Bristol, UK, ed. 2
    • R. S. Popovic, Hall Effect Devices (Institute of Physics, Bristol, UK, ed. 2, 2004).
    • (2004) Hall Effect Devices
    • Popovic, R.S.1
  • 21
    • 10344226605 scopus 로고    scopus 로고
    • note
    • The electron g factor is -0.44 for the unstrained GaAs sample and -0.63 for the strained InGaAs sample, as determined by time-resolved Faraday rotation measurements (19).
  • 27
    • 10344260591 scopus 로고    scopus 로고
    • note
    • The strained InGaAs sample is the sample E used in previous work (22, 24). We use the value of current-induced spin polarization efficiency η as defined in (22) to obtain the calibration, and assume that the ratio of KR to spin polarization is within 10% on the samples from the same wafer that are measured in these experiments. The systematic error introduced in this calibration is +48%/-38%.
  • 29
    • 10344221483 scopus 로고    scopus 로고
    • note
    • Supported by the Defense Advanced Research Projects Agency, the Defense Microelectronics Activity, and NSF.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.