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Volumn 191, Issue 1, 2005, Pages 54-58
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Preparation and characterization of rutile TiO2 thin films by mist plasma evaporation
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Author keywords
Plasma processing and deposition; Surface morphology; Titanium oxide
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Indexed keywords
EVAPORATION;
GRAIN SIZE AND SHAPE;
MORPHOLOGY;
PLASMA APPLICATIONS;
SUBSTRATES;
THIN FILMS;
MIST PLASMA EVAPORATION (MPE);
PRECURSORS;
TITANIUM DIOXIDE;
PLASMA TREATMENT;
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EID: 10244279240
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2004.04.073 Document Type: Article |
Times cited : (14)
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References (23)
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