Morphology and electrical properties of Pb1-xCd xTe/CdTe heterostructures

EPJ Applied Physics

Volumn 27, Issue 1-3, 2004, Pages 207-211

  Saucedo, E ^a,b   Corregidor, V ^a   Fornaro, L ^b   Sochinskii, N V ^c   Silveira, J ^c   Dieguez E ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b UNIVERSIDAD DE LA REPÚBLICA   (Uruguay)

^c INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DIFFRACTOMETERS; DIFFUSION; ENERGY DISPERSIVE SPECTROSCOPY; FILM GROWTH; LEAD ALLOYS; MAGNETIC FIELD EFFECTS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; TERNARY SYSTEMS; TEXTURES; VAPOR PHASE EPITAXY; X RAY DIFFRACTION;

CONDUCTIVITY OF SPECIFIC MATERIALS; CRYSTALLINE ORIENTATION AND TEXTURE; SEMICONDUCTOR SURFACES; STRUCTURE AND MORPHOLOGY;

HETEROJUNCTIONS;

EID: 10244270585     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2004141     Document Type: Conference Paper

References (20)

1. Properties of narrow gap cadmium-based compounds, in EMIS Data Reviews Series No. 10, edited by P. Capper (Inspec publication, 1994)
2. L. Fornaro, E. Saucedo, L. Mussio, A. Gancharov, F. Guimaraes, A. Hernandes, IEEE Trans. Nucl. Sci. 49, 3300 (2002)
3. L. Fornaro, E. Saucedo, L. Mussio, L. Yerman, X. Ma, A. Burger, Nucl. Instrum. Methods A 458, 406 (2001)
4. J. C. Lund, K. S. Shah, M. R. Squillante, L. P. Moy, F. Sinclair, G. Entine, Nucl. Instrum. Methods A 283, 299 (1989)
5. N. Sochinskii, C. Marín, J. Rojo, V. Muñoz, C. Bocchi, E. Diéguez, J. Cryst. Growth 171, 425 (1997)
6. N. Sochinskii, C. Reig, V. Muñoz, J. Alamo. J. Cryst. Growth 192, 142 (1998)
7. N. Sochinskii, C. Reig, I. Mora-Seró, J. Peraza, V. Muñoz, Thin Solid Film 381, 48 (2000)
8. Y. Eisen, A. Shor, J. Cryst. Growth 184/185, 1302 (1998)
9. A. Melinkov, A. Sigov, K. Vorotilov, A. Davydov, L. Topalova, N. Zhavoronkov, J. Cryst. Growth 197, 666 (1999)
10. T. Hayashi, P. Gu, M. Watanabe, J. Phys. Soc. Jpn 63, 2089 (1994)
11. K. Nakagawa, K. Maeda, S. Takeuchi, Appl. Phys. Lett. 34, 574 (1979)
12. C. Wan, D. Weirauch, R. Koerenstein, E. Bylander, C. Castro, J. Electron. Mater. 15, 151 (1986)
13. N. Sochinskii, J. C. Soares, E. Alves, M. F. da Silva, P. Franzosi, S. Bernardi, E. Diéguez, J. Cryst. Growth 161, 195 (1996)
14. J. Welty, Fundaments of Momentum, Heat and Mass Transfer, 2nd edn. (John Wiley & Sons Inc., 2001), p. 623
15. M. Mo, J. Zeng, X. Liu, W. Yu, S. Zhang, Y. Qian, Adv. Mater. 14, 1658 (2002)
16. Nugraha, W. Tamura, O. Itoh, T. Amemiya, K. Suto, J. Nishizawa, J. Cryst. Growth 222, 38 (2001)
17. V. Muñoz, A. Lasbley, S. Klotz, R. Troboulet, J. Cryst. Growth 196, 71 (1999)
18. D. Brun-Le-Cunff, T. Baron, B. Daudin, S. Tatarenko, B. Blanchard, Appl. Phys. Lett. 67, 965 (1995)
19. A. Belenchuk, A. Fedorov, H. Huhtinen, V. Kantser, R. Laiho, O. Shapoval, V. Zakhvalinskii, Thin Solid Film 358, 277 (2000)
20. R. Turchetta, W. Dulinski, D. Husson, J. L. Riester, M. Schieber, A. Zuck, L. Melekhov, Y. Saado, H. Hermori, J. Nissenbaum, Nucl. Instrum. Methods A 428, 88 (1999)