Separation technique of sub-micron particles using electrokinetically driven flow

Nippon Kikai Gakkai Ronbunshu, B Hen/Transactions of the Japan Society of Mechanical Engineers, Part B

Volumn 70, Issue 697, 2004, Pages 2378-2385

  Yamamoto, Takahiro ^c   Devasenathipathy, Shankar ^b   Sato, Yohei ^c   Hishida, Koichi ^a  

^a KEIO UNIVERSITY   (Japan)

^b Stanford University   (United States)

^c NONE

Author keywords

Conductivity; Electrokinetic Phenomena; Micro PIV; Selective Separation; Sub Micron Particles

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; FLOW OF FLUIDS; IMAGING TECHNIQUES; IONIC CONDUCTION;

ELECTROKINETIC PHENOMENA; MICRO-PIV; SELECTIVE SEPARATION; SUB-MICRON PARTICLES;

FLUIDICS;

EID: 10044262195     PISSN: 03875016     EISSN: None     Source Type: Journal    
DOI: 10.1299/kikaib.70.2378     Document Type: Article

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