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Volumn 2, Issue , 2004, Pages 525-529

Aging model of polyethylene-based materials for HV cables founded on damage inception and growth from air-filled voids

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; DIELECTRIC PROPERTIES; ELECTRIC POTENTIAL; GROWTH (MATERIALS); HVDC POWER TRANSMISSION; IMPACT IONIZATION; INSPECTION; INTERFACES (MATERIALS); POLYETHYLENES;

EID: 10044253363     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (8)
  • 1
    • 0000932641 scopus 로고
    • Low-energy electron transmission and secondary-electron emission experiments on crystalline and molten long-chain alkanes
    • N. Ueno et al., "low-energy electron transmission and secondary-electron emission experiments on crystalline and molten long-chain alkanes", Phys. Rev. B, vol. 34, pp. 6386-6393, 1986.
    • (1986) Phys. Rev. B , vol.34 , pp. 6386-6393
    • Ueno, N.1
  • 3
    • 0035179849 scopus 로고    scopus 로고
    • Theoretical study of inception mechanism and growth of defect-induced damages in cable polymeric insulation
    • Kitchener, Canada, October
    • G.C. Montanari, G. Mazzanti, S. Serra, "Theoretical study of inception mechanism and growth of defect-induced damages in cable polymeric insulation", Proc. IEEE CEIDP, pp. 644-647, Kitchener, Canada, October 2001.
    • (2001) Proc. IEEE CEIDP , pp. 644-647
    • Montanari, G.C.1    Mazzanti, G.2    Serra, S.3
  • 4
    • 10044297919 scopus 로고    scopus 로고
    • Theoretical model of inception mechanism and growth of defect-induced damages in XLPE cable
    • submitted to
    • S. Serra, G.C. Montanari, G. Mazzanti, "Theoretical model of inception mechanism and growth of defect-induced damages in XLPE cable", submitted to J. Appl. Phys., 2004.
    • (2004) J. Appl. Phys.
    • Serra, S.1    Montanari, G.C.2    Mazzanti, G.3
  • 5
    • 0031251112 scopus 로고    scopus 로고
    • Nanoscopic aspects of electronic aging in dielectrics
    • L. Sanche, "Nanoscopic aspects of electronic aging in dielectrics", IEEE Trans. El. Insul., vol. 4, pp.507-543,1997.
    • (1997) IEEE Trans. El. Insul. , vol.4 , pp. 507-543
    • Sanche, L.1
  • 6
    • 0000104555 scopus 로고
    • Theory of electron avalanche in solids
    • M. Sparks, D.L. Mills et al., "Theory of electron avalanche in solids", Phys.Rev B, vol.24, pp.3519-3535, 1981
    • (1981) Phys.Rev B , vol.24 , pp. 3519-3535
    • Sparks, M.1    Mills, D.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.