An evaluation of a bake-out of the agis instrument on the Chandra X-ray Observatory

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5488, Issue PART 1, 2004, Pages 251-263

  Plucinsky, Paul P ^a   O'Dell, Stephen L ^b   Tice, Neil W ^c   Swartz, Douglas A ^b   Bautz, Marshall W ^d   DePasquale, Joseph M ^a   Edgar, Richard J ^a   Garmire, Gordon ^e   Giordano, Rino ^f   Grant, Catherine E ^d   Knollenberg, Perry ^f   Kissel, Steve ^d   LaMar, Beverly ^d   Logan, Richard ^f   Mach, Martin ^f   Marshall, Herman L ^d   McKendrick, Leon ^f   Prigozhin, Gregory ^d   Schwartz, Dan ^a   Schulz, Norbert S ^d   Shropshire, Dan ^f   Trinh, Tan ^f   Vikhlinin, Alexey A ^a   Virani, Shanil N ^a   more..

^a HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

^b NASA MARSHALL SPACE FLIGHT CENTER   (United States)

^c LOCKHEED MARTIN   (United States)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^e PENNSYLVANIA STATE UNIVERSITY   (United States)

^f NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

ACIS; CCDs; Chandra; Charge Coupled Devices; CXO; Molecular contamination; Optical filters; X ray detectors; X ray spectroscopy

Indexed keywords

ADVANCED CHARGE COUPLED DEVICE (CCD) IMAGING SPECTROMETER (ACIS); CHANDRA; CHANDRA X-RAY OBSERVATORY (CXO); MOLECULAR CONTAMINATION; X-RAY DETECTORS;

CHARGE COUPLED DEVICES; IMAGING SYSTEMS; OPTICAL FILTERS; ROBUSTNESS (CONTROL SYSTEMS); SENSITIVITY ANALYSIS; SPECTROMETERS; THERMAL CYCLING; X RAY SPECTROSCOPY;

X RAY ANALYSIS;

EID: 10044247444     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.552029     Document Type: Conference Paper

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