Thermal face recognition over time

Proceedings - International Conference on Pattern Recognition

Volumn 4, Issue , 2004, Pages 187-190

  Socolinsky, Diego A ^a   Selinger, Andrea ^b  

^a Equinox Corporation   (United States)

^b Equinox Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA SETS; TESTING IMAGES; THERMAL INFRARED IMAGERY; THERMAL RECOGNITION;

ALGORITHMS; CAMERAS; DATA REDUCTION; IMAGE ANALYSIS; INFRARED RADIATION; INTERPOLATION; LIGHTING; PRINCIPAL COMPONENT ANALYSIS;

FACE RECOGNITION;

EID: 10044246999     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.2004.1333735     Document Type: Conference Paper

References (11)

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