Thermal face recognition in an operational Scenario

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 2, Issue , 2004, Pages

  Socolinsky, Diego A ^a   Selinger, Andrea ^b  

^a Equinox Corporation   (United States)

^b Equinox Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOMETRIC IDENTIFICATION; OPERATIONAL SCENARIO; THERMAL FACE RECOGNITION; THERMAL IMAGERY;

ALGORITHMS; DATABASE SYSTEMS; IMAGING TECHNIQUES; INFRARED RADIATION; STATISTICS; THERMAL EFFECTS;

FACE RECOGNITION;

EID: 5044224048     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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