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Volumn 85, Issue 5, 2002, Pages 1169-1172

Origin of microwave dielectric loss in ZnNb2O6-TiO2

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; DIELECTRIC LOSSES; ELECTRIC CONDUCTIVITY; PHASE TRANSITIONS; SYNTHESIS (CHEMICAL); TITANIUM DIOXIDE; ZINC COMPOUNDS;

EID: 0036573299     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2002.tb00240.x     Document Type: Conference Paper
Times cited : (63)

References (23)
  • 7
    • 36849124360 scopus 로고
    • 2 supporting different defect mechanisms in vacuum-reduced and hydrogen-reduced rutile
    • (1965) J. Appl. Phys. , vol.35 , Issue.11 , pp. 3414-3416
    • Shannon, R.D.1
  • 19


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.