Time-domain modeling of lossy substrates with constant loss tangent

Proceedings - 8th IEEE Workshop on Signal Propagation on Interconnects

Volumn , Issue , 2004, Pages 151-154

  Engin, A Ege ^a   Mathis, Wolfgang ^b   John, Werner ^c   Sommer, Grit ^c   Reichl, Herbert ^c  

^a UNIVERSITY OF PADERBORN   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^c Fraunhofer Institute Reliability and Microintegration   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT LOSS TANGENT; CONTINUED FRACTION EXPANSION (CFE); FREQUENCY RANGE; SKIN EFFECTS;

APPROXIMATION THEORY; BANDWIDTH; CAPACITANCE; COMPUTER SIMULATION; FUNCTIONS; PERMITTIVITY; PRINTED CIRCUIT BOARDS;

TIME DOMAIN ANALYSIS;

EID: 10044222054     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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8. Carchon, G. and W. De Raedt and Beyne, E., "Compensating Differences Between Measurement and Calibration Wafer in Probe-Tip Calibrations," IEEE MTT-S Symposium Digest, Vol. 3, 2002, pp. 1837-40