Trace elemental analysis of glass and paint samples of forensic interest by ICP-MS using laser ablation solid sample introduction

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5071, Issue , 2003, Pages 193-204

  Almirall, José R ^a   Trejos, Tatiana ^a   Hobbs, Andria ^a   Furton, Kenneth ^a  

^a FLORIDA INTERNATIONAL UNIVERSITY   (United States)

Author keywords

Forensic comparisons; Glass evidence; ICPMS; LA ICP MS; Paint evidence

Indexed keywords

FORENSIC COMPARISONS; GLASS EVIDENCE; ICPMS; LA-ICP-MS; PAINT EVIDENCE;

AUTOMOBILES; CALIBRATION; FLUORESCENCE; GLASS; ISOTOPES; LASER ABLATION; PAINT; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY;

TRACE ELEMENTS;

EID: 0942301023     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.498106     Document Type: Conference Paper

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