An axial molecular-beam diode laser spectrometer

Review of Scientific Instruments

Volumn 75, Issue 1, 2004, Pages 46-53

  Osthoff, Hans D ^a   Jäger, Wolfgang ^a   Walls, Johnathon ^b   Van Wijngaarden, William A ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b YORK UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEXATION; DOPPLER EFFECT; LASER BEAM EFFECTS; LIGHT ABSORPTION; MILLIMETER WAVES; MOLECULAR VIBRATIONS; RESONANCE; SEMICONDUCTOR LASERS; TRACE ELEMENTS; VAN DER WAALS FORCES; VELOCITY MEASUREMENT;

MOLECULAR BEAM EXPANSION; TRACE GAS SENSING;

MOLECULAR BEAMS;

EID: 0942300182     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1634364     Document Type: Article

References (42)

1. A. De Piante, E. J. Campbell, and S. J. Buelow, Rev. Sci. Instrum. 60, 858 (1989).
2. Z. Wang, M. Eliades, K. Carron, and J. W. Bevan, Rev. Sci. Instrum. 62, 21 (1991).
3. T. A. Hu, E. L. Chappel, and S. W. Sharpe, J. Chem. Phys. 98, 6162 (1993).
4. I. Pak, M. Hepp, D. A. Roth, and G. Winnewisser, Rev. Sci. Instrum. 68, 1668 (1997).
5. J. Faist, F. Capasso, D. L. Sivco, C. Sirtori, A. L. Hutchinson, and A. Y. Cho, Science 264, 553 (1994).
6. D. Herriott, H. Kogelnik, and R. Kompfner, Appl. Opt. 3, 523 (1963).
7. J. Altmann, R. Baumgart, and C. Weitkamp, Appl. Opt. 20, 995 (1981).
8. J. U. White, J. Opt. Soc. Am. 66, 411 (1976).
9. D. Kaur, A. M. de Souza, J. Wanna, S. A. Hammad, L. Mercorelli, and D. S. Perry, Appl. Opt. 29, 119 (1990).
10. J. B. McManus, P. L. Kebabian, and M. S. Zahniser, Appl. Opt. 34, 3336 (1995).
11. C. M. Lovejoy and D. J. Nesbitt, Rev. Sci. Instrum. 58, 807 (1987).
12. P. Werle, Spectrochim. Acta, Part A 52, 805 (1996); Spectrochim. Acta, Part A 54, 197 (1998).
13. P. Werle, Spectrochim. Acta, Part A 52, 805 (1996); Spectrochim. Acta, Part A 54, 197 (1998).
14. P. Werle, K. Maurer, R. Kormann, R. Mücke, F. D'Amato, and A. Popov, Spectrochim, Acta, Part A 58, 2361 (2002).
15. M. Loewenstein, H. Jost, J. Grose, J. Eilers, D. Lynch, S. Jensen, and J. Marmie, Spectrochim. Acta, Part A 58, 2329 (2002).
16. G. Toci, P. Mazzinghi, B. Mielke, and L. Stefanutti, Opt. Lasers Eng. 37, 459 (2002).
17. D. Richter, M. Erdelyi, R. F. Curl, F. K. Tittel, C. Oppenheimer, H. J. Duffell, and M. Burton, Opt. Lasers Eng. 37, 171 (2002).
18. C. Roller, K. Namjou, J. Jeffers, W. Potter, P. J. McCann, and J. Grego, Opt. Lett. 27, 107 (2002).
19. T. J. Balle and W. H. Flygare, Rev. Sci. Instrum. 53, 33 (1981).
20. J.-U. Grabow and W. Stahl, Z. Naturforsch., A: Phys. Sci. 45, 1043 (1990).
21. Y. Xu and W. Jäger, J. Chem. Phys. 106, 7968 (1997).
22. K. A. Walker and A. R. W. McKellar, Molecul. Spectrosc. 205, 331 (2001).
23. H. D. Osthoff, W. Jäger, J. Walls, and W. A. van Wijngaarden, Proc. SPIE 4817, 249 (2002).
24. J. B. McManus and P. L. Kebabian, Appl. Opt. 29, 898 (1990).
25. http://www.hitran.com. The software package Hitran-PC 2.51 (http://www.ontar.com) was used for simulations.
26. W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in C, 2nd ed. (Cambridge University Press, Cambridge, UK, 1999), p. 547.
27. R. G. Brown, Introduction to Random Signal Analysis and Kalman Filtering (Wiley, New York, 1983).
28. R. W. Randall, M. A. Walsh, and B. J. Howard, Faraday Discuss. Chem. Soc. 85, 13 (1988).
29. M. A. Walsh, T. H. England, T. R. Dyke, and B. J. Howard, Chem. Phys. Lett. 142, 265 (1987).
30. M. J. Weida, J. M. Sperhac, D. J. Nesbitt, and J. M. Hutson, J. Chem. Phys. 101, 8351 (1994).
31. G. Winnewisser, T. Drascher, T. Giesen, I. Pak, F. Schmulling, and R. Schieder, Spectrochim. Acta, Part A 55, 2121 (1999).
32. L. Sun, I.I. Ioannou, and R. L. Kuczkowski, Mol. Phys. 88, 255 (1996).
33. H. D. Osthoff and W. Jäger (unpublished).
34. A. S. Pine and G. T. Fraser, J. Chem. Phys. 89, 100 (1988).
35. M. J. Weida and D. Nesbitt, J. Chem. Phys. 110, 156 (1999).
36. Agenda 21 and The UNCED Proceedings, edited by N. A. Robinson (Oceana, New York, 1992).
37. M. Grubb, The Kyoto Protocol: A Guide and Assessment (The Royal Institute of International Affairs, London, 1999).
38. R. M. Mihalcea, M. E. Webber, D. S. Baer, R. K. Hanson, G. S. Feller, and W. B. Chapman, Appl. Phys. B: Lasers Opt. 67, 283 (1998).
39. P. Werle, R. Mücke, F. D'Amato, and T. Lancia, Appl. Phys. B: Lasers Opt. 67, 307 (1998).
40. L. Gianfrani, P. De Natele, and G. De Natele, Appl. Phys. B: Lasers Opt. 70, 467 (2000).
41. G. Gagliardi, R. Restieri, G. De Biasio, P. De Natele, F. Cotrufo, and L. Gianfrani, Rev. Sci. Instrum. 72, 4228 (2001).
42. M. E. Webber, R. Claps, F. V. Englich, F. K. Tittel, J. B. Jeffries, and R. K. Hanson, Appl. Opt. 40, 4395 (2001).