Single event upset rate of 140 Mb/s pixel-data serializer

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 518, Issue 1-2, 2004, Pages 507-508

  Chiodini, G ^a   Appel, J A ^b   Cardoso, G ^b   Christian, D C ^b   Hall, B ^b   Hoff, J ^b   Kwan, S W ^b   Mekkaoui, A ^b   Moroni, L ^c   Uplegger, L ^c   Zimmermann, S ^b  

^a INFN SEZIONE DI LECCE   (Italy)

^b FERMI NATIONAL ACCELERATOR LABORATORY   (United States)

^c INFN SEZIONE DI MILANO   (Italy)

Author keywords

Pixel; Proton irradiation; Readout chip; Serializer; Single event upset

Indexed keywords

CMOS INTEGRATED CIRCUITS; DATA COMMUNICATION SYSTEMS; DOSIMETRY; EQUIPMENT TESTING; FIELD PROGRAMMABLE GATE ARRAYS; MICROPROCESSOR CHIPS; RADIATION COUNTERS; RADIATION DAMAGE; READOUT SYSTEMS; SIGNAL PROCESSING; SYNCHRONIZATION;

DATA SERIALIZERS; PIXELS; READOUT CHIPS; SINGLE EVENT UPSETS;

PROTON IRRADIATION;

EID: 0942299024     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.11.070     Document Type: Conference Paper

References (4)

1. BTeV collaboration, http://www.btev.fnal.gov/public_documents/btev_proposal/index.html , 2002.
2. Christian D.C., et al. Nucl. Instr. and Meth. A. 435:1999;144.
3. D.C. Christian, FERMILAB-CONF-02-319-E, December 2002.
4. Chiodini G., et al. Nucl. Instr. and Meth. A. 501:2003;183.