Preparation and characterization of PZT thin films deposited by pulsed laser deposition on template layer

Journal of the European Ceramic Society

Volumn 24, Issue 6, 2004, Pages 1629-1632

  Wang, Z J ^a   Bi, H Y ^a   Kokawa, H ^a   Zhang, L ^b   Tsaur, J ^b   Ichiki, M ^b   Maeda, R ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Electrical properties; Electron microscopy; Films; PZT; X ray methods

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTALLINE MATERIALS; PERMITTIVITY; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

TEMPLATE LAYERS;

LEAD COMPOUNDS;

FILM;

EID: 0942291188     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00394-7     Document Type: Article

References (8)

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