Effect of Annealing on Structural Properties of Co Thin Films and Co/Cu Multilayers

Materials Science Forum

Volumn 443-444, Issue , 2004, Pages 193-196

  Hecker, M ^a   Mattern, N ^a   Bruckner W ^a   Schneider, C M ^a  

^a IFW DRESDEN   (Germany)

Author keywords

Co Thin Films; Multilayers; Texture; X Ray Diffraction

Indexed keywords

ANNEALING; DATA STORAGE EQUIPMENT; GRAIN GROWTH; GRAIN SIZE AND SHAPE; MARTENSITE; MICROSTRUCTURE; MULTILAYERS; RADIATION; X RAY DIFFRACTION ANALYSIS;

GRAIN ORIENTATIONS; MAGNETOELECTRONICS;

THIN FILMS;

EID: 0842348223     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.443-444.193     Document Type: Conference Paper

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