Organic semiconductor RFID transponders

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2003, Pages 191-194

  Baude, Paul F ^a   Ender, David A ^a   Kelley, Tommie W ^a   Haase, Michael A ^a   Muyres, Dawn V ^a   Theiss, Steven D ^a  

^a 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; AMPLITUDE MODULATION; BANDWIDTH; DEGREES OF FREEDOM (MECHANICS); DIELECTRIC MATERIALS; DIODES; SEMICONDUCTING ORGANIC COMPOUNDS; SURFACE TREATMENT;

DIELECTRIC SURFACE TREATMENT; RADIO FREQUENCY IDENTIFICATION (RFID);

TRANSPONDERS;

EID: 0842331395     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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2. P. F. Baude, D. A. Ender, M. A. Haase, T. W. Kelley, D. V. Muyres, S. D. Theiss, Appl. Phys. Lett., 82, 3964 (2003)
3. H. Klauk, D. J. Gundlach, J. A. Nichols, and T. N. Jackson, IEEE Trans. Electron Devices, 46, 1258 (1999)
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5. Tommie Wilson Kelley,Larry D. Boardman, Timothy D. Dunbar, Dawn V. Muyres, Mark J. Pellerite, and Terry P. Smith, J. Phys. Chem. B, 107, 5877 (2003)
6. T. P. Brody, SPIE - Semiconductor Microlithography, 100, 140 (1977)
7. T. K. Kelley, D. V. Muyres, P. F. Baude, T. P. Smith, T.D. Jones, Materials Research Society Spring 2003 Symposium L Proceedings, paper L6.5, v. 771 (2003)