Measuring manufacturing capability based on lower confidence bounds of Cpmk applied to current transmitter process

International Journal of Advanced Manufacturing Technology

Volumn 23, Issue 1-2, 2004, Pages 116-125

  Pearn, W L ^a   Shu, Ming Hung ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b Natl Pingung Institute of Commerce   (Taiwan)

Author keywords

Lower confidence bound; Process capability index

Indexed keywords

ALGORITHMS; MICROELECTRONICS; PROBABILITY DENSITY FUNCTION; PROCESS CONTROL; STATISTICAL METHODS; TRANSMITTERS;

LOWER CONFIDENCE BOUND; PROCESS CAPABILITY INDEX;

INDUSTRIAL ENGINEERING;

EID: 0842288948     PISSN: 02683768     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00170-003-1693-z     Document Type: Article

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