Shape and stability of self-assembled surface domains

Nature Materials

Volumn 3, Issue 2, 2004, Pages 95-98

  Thayer, G E ^a   Hannon, J B ^a   Tromp, R M ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PHASE TRANSITIONS; SEMICONDUCTING SILICON; THERMODYNAMIC STABILITY;

BOUNDARY ENERGY; LONG-RANGE INTERACTION; LOW ENERGY ELECTRON MICROSCOPY;

NANOSTRUCTURED MATERIALS;

ARTICLE; ELECTRON MICROSCOPY; MATERIALS TESTING; NANOTECHNOLOGY;

MATERIALS TESTING; MICROSCOPY, ELECTRON; NANOTECHNOLOGY;

EID: 0842278756     PISSN: 14761122     EISSN: None     Source Type: Journal    
DOI: 10.1038/nmat1050     Document Type: Letter

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