An X-ray Powder Pattern Analysis Program for Imaging Plate

Review of High Pressure Science and Technology/Koatsuryoku No Kagaku To Gijutsu

Volumn 9, Issue 1, 1999, Pages 65-70

  Fujihisa, Hiroshi ^a  

^a NATL INST OF MAT AND CHEM RES   (Japan)

Author keywords

DAC; high pressure; imaging plate; x ray powder diffraction

Indexed keywords

EID: 0742327923     PISSN: 0917639X     EISSN: 13481940     Source Type: Journal    
DOI: 10.4131/jshpreview.9.65     Document Type: Article

References (3)

1. O. Shimomura, K. Takemura, H. Fujihisa, Y. Fujii, Y. Ohishi, T. Kikegawa, Y. Amemiya, and T. Matsushita: Rev. Sci. Instrum., 63. 967-973 (1992), “Appl icat ion of an imaging plate to high-pressure x-ray study with a diamond anvil cell”.
2. R. O. Piltz, M. I. McMahon, J. Grain, P. D. Hatton, R. J. Nelmes, R. J. Cernik, and G. Bushnell-Wye: Rev. Sci. Instrum., 63. 700-703, (1992), “An imaging plate system for high-pressure powder diffraction: The data processing side”.
3. A. P. Hammers ley, S. O. Svensson, M. Hanfland, A. N. Fitch, and D. Hausermann: High Pressure Research, 14, 235-248 (1996), “Two-Dimensional Detector Software: From Real Detector to Idealised Image or Two-Theta Scan”.