Computing System Failure Frequencies and Reliability Importance Measures Using OBDD

IEEE Transactions on Computers

Volumn 53, Issue 1, 2004, Pages 54-68

  Chang, Yung Ruei ^a   Amari, Suprasad V ^b   Kuo, Sy Yen ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b Relex Software Corporation   (United States)

Author keywords

BDD; Failure frequency; Fault tolerance; Imperfect coverage; Reliability importance measure; System availability

Indexed keywords

BINARY DECISION DIAGRAM (BDD); FAILURE FREQUENCY; IMPERFECT COVERAGE; RELIABILITY IMPORTANCE MEASURE; SYSTEM AVAILABILITY;

ALGORITHMS; COMPUTER SYSTEM RECOVERY; FAULT TOLERANT COMPUTER SYSTEMS; FREQUENCIES; MARKOV PROCESSES; PROBABILITY; RELIABILITY; RISK ASSESSMENT; SYSTEMS ANALYSIS;

DECISION THEORY;

EID: 0742321097     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2004.1255790     Document Type: Article

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