The dual-mode frequency-locked technique for the characterization of the temperature coefficient of permittivity of anisotropic materials

Measurement Science and Technology

Volumn 15, Issue 1, 2004, Pages 29-34

  Tobar, Michael E ^a   Hamilton, Gemma L ^a   Hartnett, John G ^a   Ivanov, Eugene N ^a   Cros, Dominique ^b   Guillon, Pierre ^b  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^b UNIVERSITY OF LIMOGES   (France)

Author keywords

Precision measurement; Sapphire resonators; Temperature coefficient permittivity; Whispering gallery modes

Indexed keywords

CRYSTAL STRUCTURE; OSCILLATORS (ELECTRONIC); PERMITTIVITY; POLARIZATION; RESONATORS; SAPPHIRE;

FREQUENCY TURNOVER TEMPERATURES;

ANISOTROPY;

ANISOTROPIC MEDIUM; MEASUREMENT METHOD; MICROWAVE RADIATION; PRECISION; PROCESSING TECHNIQUE; TEMPERATURE EFFECT;

EID: 0742304798     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/15/1/004     Document Type: Article

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