Planar Resistors for Probe Station Calibration

40th ARFTG Conference Digest - Fall 1992

Volumn , Issue , 1992, Pages 1-9

  Walker, D K ^a   Williams, D F ^a   Morgan, J M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY DOMAIN ANALYSIS; PHOTORESISTS; RESISTORS;

CIRCUIT DESIGNS; FABRICATION PROCESS; FILM RESISTANCE; IMPEDANCE BEHAVIOR; NICKEL CHROMIUM; PROBE STATIONS; RESISTIVE FILM; TIME AND FREQUENCY DOMAINS;

PROBES;

EID: 0742329697     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1992.326993     Document Type: Conference Paper

References (3)

1. G. F. IEngen and C. A. Hoer, "Thru-Reflect-Line: An Improved Technique for Calibrating the Six-Port Automatic Network Analyzer, " IEEE Trans. Microwave Theory Tech. , vol. MTT-27, pp. 987-993, Dec. 1979.
2. R. B. Marks and D. F. Williams, "Characteristic Impedance Determination Using Propagation Constant Measurement, " IEEE Microwave and Guided Wave Letters, Vol. 1, No. 6, pp. 141-143, June 1991.
3. D. F. Williams and R. B. Marks, "Transmission Line Capacitance Measurement, IEEE Microwave and Guided Wave Letters, Vol. 1, No. 9, pp. 243-245, Sept. 1991.