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Volumn 40, Issue 1, 2004, Pages 10-17

Reflectivity Measurements of Intracavity Defects in Laser Diodes

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; COMPUTER SIMULATION; FOURIER TRANSFORMS; LIGHT SCATTERING; LITHOGRAPHY; MATHEMATICAL MODELS; RESONATORS; SPURIOUS SIGNAL NOISE;

EID: 0742272664     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2003.820835     Document Type: Article
Times cited : (14)

References (10)
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    • Corbett, B.1    McDonald, D.2
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    • (1996) Proc. Inst. Elect. Eng., Pt. J , vol.143 , Issue.1 , pp. 71-76
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  • 6
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    • Defect recognition via longitudinal mode analysis of high power fundamental mode and broad area edge emitting laser diodes
    • A. Klehr, G. Beister, G. Erbert, A. Klein, J. Maege, I. Rechenberg, J. Sebastian, H. Wenzel, and G. Tränkle, "Defect recognition via longitudinal mode analysis of high power fundamental mode and broad area edge emitting laser diodes," J. Appl. Phys., vol. 90, no. 1, pp. 43-47, 2001.
    • (2001) J. Appl. Phys. , vol.90 , Issue.1 , pp. 43-47
    • Klehr, A.1    Beister, G.2    Erbert, G.3    Klein, A.4    Maege, J.5    Rechenberg, I.6    Sebastian, J.7    Wenzel, H.8    Tränkle, G.9
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.