Shearing interferometer based on second-harmonic generation and a novel technique of n2 direct measurements

Applied Optics

Volumn 36, Issue 33, 1997, Pages 8622-8625

  Drachev, Vladimir P ^a   Ertsenkin, Sergey V ^a   Perminov, Sergey V ^a   Safonov, Vladimir P ^b   Chubakov, Pavel A ^b  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^b INSTITUTE OF AUTOMATION AND ELECTROMETRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0542418315     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.008622     Document Type: Article

References (14)

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