High-sensitivity, single-beam n2 measurements

Optics Letters

Volumn 14, Issue 17, 1989, Pages 955-957

  Sheik Bahae, M ^a   Said, A A ^a   van Stryland, E W ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975582305     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.14.000955     Document Type: Article

References (13)

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