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Volumn 148, Issue 5, 2001, Pages

Etch Characteristics of Cr by Using Cl2/O2 Gas Mixtures with Electron Cyclotron Resonance Plasma

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0442278093     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1359204     Document Type: Article
Times cited : (10)

References (15)
  • 5
    • 0003601534 scopus 로고
    • Merck & Co., Inc., Rahway, NJ
    • The Merck Index, Merck & Co., Inc., M. Windholz, Editor, Rahway, NJ (1976).
    • (1976) The Merck Index
    • Windholz, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.