Contact resistance calculations: Generalizations of greenwood's formula including interface films

IEEE Transactions on Components and Packaging Technologies

Volumn 24, Issue 1, 2001, Pages 50-58

  Boyer, L ^a  

^a UNIV PARIS SUD   (France)

Author keywords

Analytical formulas; Calculation; Contact resistance; Finite element analysis; Interface film

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; INTERFACES (MATERIALS);

CONTACT RESISTANCE; GREENWOOD'S FORMULA;

ELECTRODES;

EID: 0035280089     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.910802     Document Type: Article

References (15)

1. Constriction resistance and the real area of contact
2. Computer simulation for the conductance of a contact interface
3. Film resistance and constriction effect of current in a contact interface
4. Constriction resistance of conducting spots by the boundary element method
5. Computer simulation for the constriction resistance depending on the form of conducting spots
6. Multispot model of contacts based on surface features
7. Making contacts to aged surfaces
8. The effects of wipe on contact resistance of aged surfaces
9. Electrical contact resistance: Properties of stationary interfaces
10. Constriction resistance
11. Analysis of the constriction resistance of the electric contact by the contact model using the electrolyte bath