Microstructural characterization of porous manganese thin films for electrochemical supercapacitor applications

Journal of Materials Science

Volumn 38, Issue 24, 2003, Pages 4817-4830

  Djurfors, B ^a   Broughton, J N ^a   Brett, M J ^a   Ivey, D G ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CAPACITANCE; CAPACITORS; CRYSTAL STRUCTURE; ELECTROCHEMISTRY; ELECTRON DIFFRACTION; MANGANESE COMPOUNDS; MICROSTRUCTURE; OXIDATION; PHYSICAL VAPOR DEPOSITION; POROUS MATERIALS; REDUCTION; SCANNING ELECTRON MICROSCOPY; SODIUM; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

COLUMNAR OXIDE LAYERS; PSEUDOCAPACITANCE; SUPERCAPACITORS;

THIN FILMS;

EID: 0348220657     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSC.0000004401.81145.b6     Document Type: Article

References (12)

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