SCOPUS 정보 검색 플랫폼

Volumn 83, Issue 22, 2003, Pages 4640-4642

Current suppression in a double-island single-electron transistor for detection of degenerate charge configurations of a floating double-dot

(3) Brenner, R a Greentree, Andrew D a Hamilton, A R a

a UNIVERSITY OF NEW SOUTH WALES (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTROSTATICS; EVAPORATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR QUANTUM DOTS; SUBSTRATES; TEMPERATURE MEASUREMENT; TRANSCONDUCTANCE; TRANSPORT PROPERTIES; TUNNEL JUNCTIONS;

CURRENT SUPPRESSION; DOUBLE-ISLAND SINGLE ELECTRON TRANSISTOR; FLOATING META DOUBLE DOT; LOW TEMPERATURE TRANSPORT MEASUREMENT; SOLID STATE QUANTUM COMPUTER;

TRANSISTORS;

EID: 0348107239 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1630382 Document Type: Article

Times cited : (8)

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