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Volumn 22, Issue 3-4, 2002, Pages 779-784

effects of uniaxial stress on X-ray diffraction spectra

(1)  Gauthier, M a  

a CNRS   (France)

Author keywords

Uniaxial stress; X ray diffraction

Indexed keywords

CRYSTAL LATTICES; DATA REDUCTION; LAGRANGE MULTIPLIERS; STRAIN; TENSORS; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY; X RAYS;

EID: 0348001884     PISSN: 08957959     EISSN: None     Source Type: Journal    
DOI: 10.1080/08957950212446     Document Type: Article
Times cited : (6)

References (6)
  • 6
    • 0003627422 scopus 로고
    • Fundamentals of crystallography
    • Oxford University Press, Walton street, Oxford OX2 6DP, Giacovazzo, C. (Ed.), chap. Crystallographic Computing
    • Giacovazzo, C., Monaco, H. L., Viterbo, D., Scordari, F., Gilli, G., Zanotti, G. and Catti, M. (1992). Fundamentals of crystallography. Oxford University Press, Walton street, Oxford OX2 6DP, In: Giacovazzo, C. (Ed.), IUCr Texts on Crystallography, Vol. 2, chap. Crystallographic Computing, p. 62.
    • (1992) IUCr Texts on Crystallography , vol.2 , pp. 62
    • Giacovazzo, C.1    Monaco, H.L.2    Viterbo, D.3    Scordari, F.4    Gilli, G.5    Zanotti, G.6    Catti, M.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.