SCOPUS 정보 검색 플랫폼

Science and Technology of Advanced Materials

Volumn 1, Issue 1, 2000, Pages 11-20

Crystal interface and high-resolution electron microscopy - The best partner

Author keywords

SiC grain boundary; Chemical lattice image; Crystal grain boundary; CSL model; Dangling bond; Diamond grain boundary; GaAs AIAs interface; Gold grain boundary; High resolution electron microscopy; O lattice model

Indexed keywords

EID: 0347997554 PISSN: 14686996 EISSN: None Source Type: Journal
DOI: 10.1016/S1468-6996(00)00002-4 Document Type: Article

Times cited : (9)

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