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Volumn 466, Issue , 1997, Pages 273-278
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Application of spatially resolved EELS on atomic structure determination of diamond grain boundary
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
CHEMICAL VAPOR DEPOSITION;
CRYSTAL ORIENTATION;
DIAMOND FILMS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
FILM GROWTH;
GRAIN BOUNDARIES;
SPECTRUM ANALYSIS;
THIN FILMS;
DANGLING BONDS;
CRYSTAL ATOMIC STRUCTURE;
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EID: 0030659309
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (17)
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