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Volumn 466, Issue , 1997, Pages 273-278

Application of spatially resolved EELS on atomic structure determination of diamond grain boundary

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CHEMICAL VAPOR DEPOSITION; CRYSTAL ORIENTATION; DIAMOND FILMS; ELECTRON ENERGY LOSS SPECTROSCOPY; FILM GROWTH; GRAIN BOUNDARIES; SPECTRUM ANALYSIS; THIN FILMS;

EID: 0030659309     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (17)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.