Impact of microstructure on dielectric properties of Pb(Mg 1/3Nb2/3)O3-PbTiO3 thin films

Materials Science and Engineering: B

Volumn 106, Issue 2, 2004, Pages 111-119

  Laha, Apurba ^a   Bhattacharyya, S ^a   Krupanidhi, S B ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Dielectric properties; Laser ablation; Microstructure; PMN PT thin films

Indexed keywords

CAPACITANCE; ELECTRIC FIELDS; ELECTROSTRICTION; FERROELECTRIC MATERIALS; FILM GROWTH; GRAIN SIZE AND SHAPE; LANTHANUM COMPOUNDS; LASER ABLATION; LEAD COMPOUNDS; MICROELECTROMECHANICAL DEVICES; MICROSTRUCTURE; PERMITTIVITY; PHASE TRANSITIONS; PLATINUM; SILICON;

ELECTROSTRICTIVE MATERIALS; RELAXOR FILMS;

THIN FILMS;

EID: 0347985274     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2003.08.001     Document Type: Article

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