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Volumn 340-342, Issue , 2003, Pages 210-215

Excitonic properties of the polar faces of bulk ZnO after wet etching

Author keywords

AFM; Etch; Exciton; ZnO

Indexed keywords

ACETIC ACID; ATOMIC FORCE MICROSCOPY; ENERGY GAP; ETCHING; EXCITONS; HYDROCHLORIC ACID; LIGHT EMITTING DIODES; PHOSPHORIC ACID; PHOTOLUMINESCENCE; POLISHING; QUENCHING; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS; SURFACE TOPOGRAPHY;

EID: 0347946924     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2003.09.027     Document Type: Conference Paper
Times cited : (16)

References (14)
  • 4
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    • Joseph M., et al. Physica B. 302-303:2001;140.
    • (2001) Physica B , vol.302-303 , pp. 140
    • Joseph, M.1
  • 5
    • 0034972148 scopus 로고    scopus 로고
    • Yamamoto, et al. Physica B. 302-303:2001;155.
    • (2001) Physica B , vol.302-303 , pp. 155
    • Yamamoto1
  • 6
    • 0347257680 scopus 로고    scopus 로고
    • Rubicon Technology Inc, 9931-20 Franklin Ave., Franklin Park, IL 60131, USA
    • Rubicon Technology Inc, 9931-20 Franklin Ave., Franklin Park, IL 60131, USA.
  • 9
  • 10


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.