Comparative EIS and XPS studies of the protective character of thin lacquer films containing CR or P salts formed on galvanised steel, galvanneal and galfan substrates

Electrochimica Acta

Volumn 49, Issue 6, 2004, Pages 951-964

  Feliu Jr , S ^a   Barranco, V ^a  

^a DEPARTMENT OF PHYSICAL METALLURGY   (Spain)

Author keywords

Chromating; EIS; Lacquer film; Phosphating; XPS; Zinc base coatings

Indexed keywords

ALUMINA; ATMOSPHERIC HUMIDITY; CAPACITANCE; CHARGE TRANSFER; CHROMIUM COMPOUNDS; COMPOSITION; ELECTROCHEMISTRY; GALVANIZED METAL; INSULATING MATERIALS; LACQUERS; REDUCTION; SALTS; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

GALFAN SUBSTRATES;

THIN FILMS;

EID: 0347899504     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2003.10.007     Document Type: Article

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