Carrier type reversal in PbxGe42-xSe58 and Pb20GeySe80-y glasses exhibited in thermal diffusivity measurements

Journal of Optoelectronics and Advanced Materials

Volumn 3, Issue 2, 2001, Pages 467-472

  Ganesan, R ^a   Thangaraju, B ^a   Sangunni, K S ^a   Gopal, E S R ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Disordered systems; Semiconductors; Thermodynamic

Indexed keywords

ENERGY GAP; GLASS; SEMICONDUCTING GERMANIUM; SEMICONDUCTOR MATERIALS; THERMAL DIFFUSION IN SOLIDS; THERMAL DIFFUSIVITY; THERMODYNAMICS;

ANOMALOUS BEHAVIOR; COMPOSITION DEPENDENCE; DIFFUSIVITY MEASUREMENTS; DISORDERED SYSTEM; ELECTRICAL CONDUCTIVITY; METALLIC ELEMENTS; PHOTOACOUSTIC CELL; PHOTOACOUSTIC TECHNIQUES;

SELENIUM COMPOUNDS;

EID: 0347866971     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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