Origin of carrier-type reversal in Pb-Ge-Se glasses: A detailed thermal, electrical, and structural study

Journal of Physical Chemistry B

Volumn 101, Issue 47, 1997, Pages 9717-9726

  Vaidhyanathan, B ^a   Murugavel, S ^a   Asokan, S ^a   Rao, K J ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; COMPOSITION EFFECTS; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON MICROSCOPY; ELECTRON TRANSITIONS; LEAD COMPOUNDS; MELTING; QUENCHING; RAMAN SPECTROSCOPY; THERMODYNAMIC PROPERTIES; X RAY DIFFRACTION ANALYSIS;

CHALCOGENIDE GLASS;

SEMICONDUCTING GLASS;

EID: 0031269273     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp972129+     Document Type: Article

References (54)