X-ray topographic characterization of growth defects in sillenite type crystals

Annales de Chimie: Science des Materiaux

Volumn 22, Issue 8, 1997, Pages 687-690

  Martinez Lopez, J ^a   Gonzalez Manas M ^a   Rojo, J C ^b   Capelle, B ^c   Caballero, M A ^a   Dieguez, E ^b  

^a UNIVERSITY OF CÁDIZ   (Spain)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347775567     PISSN: 01519107     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

1. TANGUAY (A.R.), Doctoral dissertation, 1977, Department of Physics, Yale University.
2. GROUSSON (R.), HENRY (M.), MALLICK (S), J. Appl.Phys., 1984, 56, 224.
3. HERRIAU (J.), HUIGNARD (J.), Appl. Phys. Lett., 1986, 42, 1140.
4. HUIGNARD (J.), HERRIAU (J.), VALENTINO (T.), Appl. Optics, 1977, 16, 2769.
5. SANTOS (M.T.), ROJO (J.C.), ARIZMENDI (L.), DIEGUEZ (E.), J. Crystal Growth, 1994, 142, 103.
6. MARTINEZ-LOPEZ (J.), CABALLERO (M.A.), SANTOS (M.T.), ARIZMENDI (L.), DIEGUEZ (E.), J. Crystal Growth, 1993, 128, 852.
7. MARTINEZ-LOPEZ (J.), GONZALEZ-MANAS (M.), CABALLERO (M.A.), DIEGUEZ (E.), CAPELLE (B.), J. Crystal Growth, 1996, 166, 325.
8. ROJO (J.C.), Doctoral dissertation, 1997, Dpto Física de Materiales, Universidad Autónoma de Madrid.