Synchrotron X-ray topography of bismuth silicon oxide crystals

Journal of Crystal Growth

Volumn 166, Issue 1-4, 1996, Pages 325-328

  Martinez Lopez J ^a   Gonzalez Manas M ^a   Caballero, M A ^a   Dieguez E ^b   Capelle, B ^c  

^a UNIVERSITY OF CÁDIZ   (Spain)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL GROWTH FROM MELT; INTERFACES (MATERIALS); X RAY ANALYSIS;

SYNCHROTRON X RAY TOPOGRAPHY;

DISLOCATIONS (CRYSTALS);

EID: 0030230764     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(96)00107-8     Document Type: Article

References (6)

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3. J. Martínez-López, M. González-Mañas, M.A. Caballero, E. Diéguez and B. Capelle, J. Physique IV, 4 (1994) 169.
4. J. Martínez-López, M.A. Caballero, M.T. Santos, L. Arizmendi and E. Diéguez, J. Crystal Growth 128 (1993) 852.
5. J.C. Brice, J. Crystal Growth 6 (1970) 205.
6. H. Klapper and H. Klippers, Acta Cryst, A 29 (1973) 495.