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Volumn 76, Issue 2, 2000, Pages 87-94

Effect of pinhole Au/Ni/Cu substrate on self-alignment of advanced packages

Author keywords

Advanced packages ( BGA); Pinhole Au Ni Cu substrate; Self alignment

Indexed keywords


EID: 0347740313     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00413-X     Document Type: Article
Times cited : (8)

References (14)
  • 1
    • 0346013055 scopus 로고    scopus 로고
    • Fine line PCB assembly leads to new test issues
    • January
    • M. Teska, Fine line PCB assembly leads to new test issues, Electronic Packaging and Production, January 1998, pp. 54-56.
    • (1998) Electronic Packaging and Production , pp. 54-56
    • Teska, M.1
  • 2
    • 0347904356 scopus 로고    scopus 로고
    • Self-centering of BGAs and solder interconnects
    • August
    • S. Greathouse, Self-centering of BGAs and solder interconnects, Electronic Packaging and Production, August 1997, pp. 65-72.
    • (1997) Electronic Packaging and Production , pp. 65-72
    • Greathouse, S.1
  • 3
    • 0028725916 scopus 로고
    • Studies on solder self-alignment
    • IEEE Lasers and Electro-Optics Society
    • Y.C. Lee, Studies on solder self-alignment, LEOS'94 Conference Proceedings, IEEE Lasers and Electro-Optics Society, vol. 1, 1994, pp. 73-74.
    • (1994) LEOS'94 Conference Proceedings , vol.1 , pp. 73-74
    • Lee, Y.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.