메뉴 건너뛰기




Volumn 42, Issue 11, 2003, Pages 3279-3284

Recording on As2S3 glassy films by pulsed and continuous illumination - Optical evaluation and comparison

Author keywords

As2S3 glassy films; Continuous Illumination; Photosensitivity; Pulsed illumination; Recording

Indexed keywords

APPROXIMATION THEORY; ARSENIC COMPOUNDS; DIFFRACTION GRATINGS; DIFFRACTIVE OPTICS; INTERFEROMETRY; OPTICAL RECORDING; PHOTOSENSITIVITY; REFRACTIVE INDEX;

EID: 0347694574     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1616561     Document Type: Conference Paper
Times cited : (5)

References (18)
  • 1
    • 36849098948 scopus 로고
    • Laser-induced refractive-index change in As-SGe glasses
    • Y. Ohmachi and T. Igo, "Laser-induced refractive-index change in As-SGe glasses," Appl. Phys. Lett. 20, 506-508 (1972).
    • (1972) Appl. Phys. Lett. , vol.20 , pp. 506-508
    • Ohmachi, Y.1    Igo, T.2
  • 2
    • 0016048265 scopus 로고
    • Surface relief holograms in evaporated arsenic trisulfide films
    • S. A. Keneman, "Surface relief holograms in evaporated arsenic trisulfide films," Thin Solid Films 21, 281-285 (1974).
    • (1974) Thin Solid Films , vol.21 , pp. 281-285
    • Keneman, S.A.1
  • 3
    • 0016974816 scopus 로고
    • Hologram recording in amorphous semiconductor films
    • T. Suhara, H. Nishihara, and J. Koyama, "Hologram recording in amorphous semiconductor films," Electron. Commun. C59(7), 116-122 (1976).
    • (1976) Electron. Commun. , vol.C59 , Issue.7 , pp. 116-122
    • Suhara, T.1    Nishihara, H.2    Koyama, J.3
  • 4
    • 0012273606 scopus 로고
    • Effect of temperature on diffraction efficiency of holograms recorded in arsenic trisulfide thin films
    • A. Singh, R. A. Lessard, and M. Samson, "Effect of temperature on diffraction efficiency of holograms recorded in arsenic trisulfide thin films," Opt. Acta 31, 1161-1165 (1984).
    • (1984) Opt. Acta , vol.31 , pp. 1161-1165
    • Singh, A.1    Lessard, R.A.2    Samson, M.3
  • 5
    • 0010394195 scopus 로고
    • Photographic processes on the base of chalcogenide glassy semiconductors
    • A. L. Kartuzhansky, Ed., Khimia, Leningrad
    • V. M. Lyubin, "Photographic processes on the base of chalcogenide glassy semiconductors," in Non-Silver Photographic Processes, A. L. Kartuzhansky, Ed., pp. 193-222, Khimia, Leningrad (1985).
    • (1985) Non-silver Photographic Processes , pp. 193-222
    • Lyubin, V.M.1
  • 7
    • 0031393396 scopus 로고    scopus 로고
    • Holographic recording in amorphous chalcogenide semiconductor photoresists
    • J. Teteris, "Holographic recording in amorphous chalcogenide semiconductor photoresists," Proc. SPIE 3347, 52-57 (1998).
    • (1998) Proc. SPIE , vol.3347 , pp. 52-57
    • Teteris, J.1
  • 10
    • 0346856300 scopus 로고    scopus 로고
    • Infrared microlens arrays based on chalcogenide photoresist, fabricated by thermal reflow process
    • N. P. Eisenberg, M. Klebanov, V. Lyubin, M. Manevich, and S. Noach, "Infrared microlens arrays based on chalcogenide photoresist, fabricated by thermal reflow process," J. Optoelectron. Adv. Mater. 2(2), 147-152 (2000).
    • (2000) J. Optoelectron. Adv. Mater. , vol.2 , Issue.2 , pp. 147-152
    • Eisenberg, N.P.1    Klebanov, M.2    Lyubin, V.3    Manevich, M.4    Noach, S.5
  • 13
    • 0348134627 scopus 로고
    • On the effect of light pulses on the films of chalcogenide glassy semiconductors
    • A. V. Kolobov and N. Sebastian, "On the effect of light pulses on the films of chalcogenide glassy semiconductors," Sov. Phys. Tech. Phys. 54, 185-186 (1984).
    • (1984) Sov. Phys. Tech. Phys. , vol.54 , pp. 185-186
    • Kolobov, A.V.1    Sebastian, N.2
  • 14
    • 0342466911 scopus 로고
    • Photosensitivity of amorphous semiconductor films As-S and As-Se at laser excitation with persistent radiation and nanosec- or picosec pulses
    • G. Vartman, R. V. Danelus, Yu. Kluge, and A. O. Ozols, "Photosensitivity of amorphous semiconductor films As-S and As-Se at laser excitation with persistent radiation and nanosec- or picosec pulses," Avtometrija 1, 80-94 (1987).
    • (1987) Avtometrija , vol.1 , pp. 80-94
    • Vartman, G.1    Danelus, R.V.2    Kluge, Yu.3    Ozols, A.O.4
  • 18
    • 0003989394 scopus 로고
    • Unitech Division, New York
    • H. P. Hsu, Fourier Analysis, Unitech Division, New York (1967).
    • (1967) Fourier Analysis
    • Hsu, H.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.