Physics with Highly-Charged Ions in an EBIT

Hyperfine Interactions

Volumn 146-147, Issue 1-4, 2003, Pages 109-113

  López Urrutia, J R Crespo ^a   Bapat, B ^a   Draganic I ^a   Feuerstein, B ^a   Fischer, D ^a   Lorch H ^a   Moshammer, R ^a   Ullrich, J ^a   Dubois, R D ^b   Zou, Y ^c  

^a MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^b MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^c FUDAN UNIVERSITY   (China)

Author keywords

Highly charged ions; Ion sources; Ion atom collisions; Ion electron collisions; Recoil ion momentum spectroscopy; Spectroscopy

Indexed keywords

ARGON; HELIUM;

CONFERENCE PAPER; DIELECTRIC CONSTANT; ELECTRON BEAM; OPTICS; PHYSICS; SPECTROSCOPY;

EID: 0347624696     PISSN: 03043843     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:HYPE.0000004204.20534.00     Document Type: Conference Paper

References (6)

1. Crespo López-Urrutia, J. R. et al., Phys. Scr. T 80 (1999), 502; Crespo López-Urrutia, J. R. et al., Hyp. Interact. 127 (2000), 497; Crespo López-Urrutia, J. R. et al., Phys. Scr. T 92 (2001), 110.
2. Crespo López-Urrutia, J. R. et al., Phys. Scr. T 80 (1999), 502; Crespo López-Urrutia, J. R. et al., Hyp. Interact. 127 (2000), 497; Crespo López-Urrutia, J. R. et al., Phys. Scr. T 92 (2001), 110.
3. Crespo López-Urrutia, J. R. et al., Phys. Scr. T 80 (1999), 502; Crespo López-Urrutia, J. R. et al., Hyp. Interact. 127 (2000), 497; Crespo López-Urrutia, J. R. et al., Phys. Scr. T 92 (2001), 110.
4. Ullrich, J. et al., J. Phys. B 30 (1997), 2917 (topical review).
5. Fischer, D. et al., this volume; Fischer, D. et al., J. Phys. B 35 (2002), 1369.
6. Fischer, D. et al., this volume; Fischer, D. et al., J. Phys. B 35 (2002), 1369.