-
2
-
-
0041475673
-
-
IEEE, Piscataway, NJ
-
S. Subbana, D. Ahigren, D. Hatame, and B. Meyerson, 1999 IEEE International Solid-State Circuits Conference Digest of Technical Papers (IEEE, Piscataway, NJ, 1999), p. 508.
-
(1999)
1999 IEEE International Solid-state Circuits Conference Digest of Technical Papers
, pp. 508
-
-
Subbana, S.1
Ahigren, D.2
Hatame, D.3
Meyerson, B.4
-
6
-
-
0347272902
-
-
to be published
-
M. Griglione, T. J. Anderson, Y. Haddara, M. E. Law, K. S. Jones, and A. van de Bogaard, J. Appl. Phys. (to be published).
-
J. Appl. Phys.
-
-
Griglione, M.1
Anderson, T.J.2
Haddara, Y.3
Law, M.E.4
Jones, K.S.5
Van De Bogaard, A.6
-
7
-
-
0041976844
-
-
G. Prudon, B. Gautier, S. Berthelemy, J. C. Dupuy, C. Dubois, J. Schmitt, J. Delmas, and J. P. Vallard, Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) 1997, Vol. 11, p. 339.
-
(1997)
Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI)
, vol.11
, pp. 339
-
-
Prudon, G.1
Gautier, B.2
Berthelemy, S.3
Dupuy, J.C.4
Dubois, C.5
Schmitt, J.6
Delmas, J.7
Vallard, J.P.8
-
8
-
-
0042978415
-
-
J. P. Newey, D. J. Robbins, and D. Wallis, Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) 1997, Vol. 11, p. 979.
-
(1997)
Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI)
, vol.11
, pp. 979
-
-
Newey, J.P.1
Robbins, D.J.2
Wallis, D.3
-
9
-
-
21544437231
-
-
H.-J. Gossmann, A. M. Vredenberg, C. S. Rafferty, H. S. Luftman, F. C. Unterwald, D. C. Jacobson, T. Boone, and J. M. Poate, J. Appl. Phys. 74, 3150 (1993).
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 3150
-
-
Gossmann, H.-J.1
Vredenberg, A.M.2
Rafferty, C.S.3
Luftman, H.S.4
Unterwald, F.C.5
Jacobson, D.C.6
Boone, T.7
Poate, J.M.8
-
10
-
-
0042477489
-
-
University of Florida Press, Gainesville, FL
-
M. E. Law, FLOOPS User's Manual (University of Florida Press, Gainesville, FL, 1996).
-
(1996)
FLOOPS User's Manual
-
-
Law, M.E.1
-
12
-
-
3743068748
-
-
N. E. B. Cowern, W. J. Kersten, R. C. M. de Kruif, J. G. M. van Berkum, W. B. de Boer, D. J. Gravesteijn, and C. W. T. Bulle-Liewma, Proc.-Electrochem. Soc. 96-4, 195 (1996).
-
(1996)
Proc.-Electrochem. Soc.
, vol.96
, Issue.4
, pp. 195
-
-
Cowern, N.E.B.1
Kersten, W.J.2
De Kruif, R.C.M.3
Van Berkum, J.G.M.4
De Boer, W.B.5
Gravesteijn, D.J.6
Bulle-Liewma, C.W.T.7
-
13
-
-
12044253285
-
-
N. E. B. Cowern, P. C. Zalm, P. van der Sluis, D. J. Gravesteijn, and W. B. de Boer, Phys. Rev. Lett. 72, 2585 (1994).
-
(1994)
Phys. Rev. Lett.
, vol.72
, pp. 2585
-
-
Cowern, N.E.B.1
Zalm, P.C.2
Van Der Sluis, P.3
Gravesteijn, D.J.4
De Boer, W.B.5
-
14
-
-
0347272901
-
-
Ph.D. thesis, University of Florida
-
S. Chaudhry, Ph.D. thesis, University of Florida, 1996.
-
(1996)
-
-
Chaudhry, S.1
-
15
-
-
0042216576
-
-
S. T. Ahn, H. W. Kennel, J. D. Plummer, and W. A. Tiller, J. Appl. Phys. 64, 4914 (1988).
-
(1988)
J. Appl. Phys.
, vol.64
, pp. 4914
-
-
Ahn, S.T.1
Kennel, H.W.2
Plummer, J.D.3
Tiller, W.A.4
-
16
-
-
0029207684
-
-
K. Osada, Y. Zaitsu, S. Matsumoto, M. Yoshida, E. Arai, and T. Abe, J. Electrochem. Soc. 142, 202 (1995).
-
(1995)
J. Electrochem. Soc.
, vol.142
, pp. 202
-
-
Osada, K.1
Zaitsu, Y.2
Matsumoto, S.3
Yoshida, M.4
Arai, E.5
Abe, T.6
|