On the highly selective ZnO:Al2O3 based thick film hydrogen sensors

Journal of Materials Science Letters

Volumn 16, Issue 23, 1997, Pages 1952-1954

  Jayadev Dayan, N ^a   Sainkar, S R ^b   Belkehar, A A ^b   Karekar, R N ^a   Aiyer, R C ^a  

^a UNIVERSITY OF PUNE   (India)

^b NATIONAL CHEMICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHEMICAL SENSORS; GRAIN SIZE AND SHAPE; HYDROGEN; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACES; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

HYDROGEN SENSOR; SENSITIVITY FACTOR;

THICK FILMS;

EID: 0347589830     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018503104557     Document Type: Article

References (9)

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