메뉴 건너뛰기




Volumn 766, Issue , 2003, Pages 191-195

Advanced characterization of ultra-low-k periodic porous silica films - Pore size distribution, pore-diameter anisotropy, and size and macroscopic isotropy of domain structure

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CHARACTERIZATION; CRYSTAL STRUCTURE; OPTICAL VARIABLES MEASUREMENT; PORE SIZE; POROUS MATERIALS; SILICA; TRANSMISSION ELECTRON MICROSCOPY; X RAY SCATTERING;

EID: 0347569412     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-766-e9.6     Document Type: Conference Paper
Times cited : (4)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.