Orientation effect on the exchange fields of NiFeO/NiFe bilayers

Journal of Applied Physics

Volumn 85, Issue 8 II B, 1999, Pages 6115-6117

  Lai, Chih Huang ^a   Wang, C P ^b   Qian, Chester ^c  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b STANFORD UNIVERSITY   (United States)

^c WESTERN DIGITAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347487833     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370279     Document Type: Article

References (5)

1. C. H. Lai, R. L. White, C. P. Wang, and T. C. Anthony, J. Appl. Phys. 83, 6816 (1998).
2. C. H. Lai, W. E. Bailey, R. L. White, and T. C. Anthony, J. Appl. Phys. 81, 4990 (1997).
3. D. Mauri, H. C. Siegmann, P.S. Bagus, and E. Kay, J. Appl. Phys. 62, 3047 (1987).
4. A. P. Malozemoff, J. Appl. Phys. 63, 3874 (1988).
5. C. P. Wang, K. B. Do, M. R. Beasley, T. H. Geballe, and R. H. Hammond, Appl. Phys. Lett. 71, 2599 (1997).