Electron-impact dissociation of CH+ ions: Measurement of C+ fragment ions

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 68, Issue 4 A, 2003, Pages

  Bannister, M E ^a   Krause, H F ^a   Vane, C R ^a   Djuric N ^b,f   Popovic D B ^b   Stepanovic M ^b   Dunn, G H ^b   Chung, Y S ^c   Smith, A C H ^d   Wallbank, B ^e  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

^c Chungnam National University   (South Korea)

^d UNIVERSITY COLLEGE LONDON   (United Kingdom)

^e ST FRANCIS XAVIER UNIVERSITY   (Canada)

^f CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISSOCIATION; ELECTRONIC DENSITY OF STATES; IONIZATION; MOLECULAR DYNAMICS; PROTONS; STORAGE RINGS;

CHANNEL ELECTRON MULTIPLIER; DISSOCIATIVE EXCITATION; DISSOCIATIVE IONIZATION; ELECTRON-IMPACT DISSOCIATION;

ELECTRON TRANSPORT PROPERTIES;

EID: 0347477099     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (32)

1. H. Tawara, in Atomic and Molecular Processes in Fusion Plasmas, edited by R. K. Janev (Plenum, New York, 1995), pp. 461-496.
2. R.K. Janev, T. Kato, and J.G. Wang, Phys. Plasmas 7, 4364 (2000).
3. A. Dalgarno, in Atomic Processes and Applications, edited by P.G. Burke and B.L. Moiseiwitsch (North-Holland, Amsterdam, 1976), pp. 109-132.
4. J. Luque, W. Juchmann, E.A. Brinkman, and J.B. Jeffries, J. Vac. Sci. Technol. A 16, 397 (1998).
5. X.D. Zhu, R.J. Zhan, H.Y. Zhou, X.H. Wen, and D. Li, J. Vac. Sci. Technol. A 20, 941 (2002).
6. W. Zong, G.H. Dunn, N. Djurić, M. Larsson, C.H. Greene, A. Al-Khalili, A. Neau, A.M. Derkatch, L. Vikor, W. Shi, A. Le Padellec, S. Rosén, H. Danared, and M. af Ugglas, Phys. Rev. Lett. 83, 951 (1999).
7. A. Le Padellec, N. Djurić, A. Al-Khalili, H. Danared, A.M. Derkatch, A. Neau, D.B. Popović, S. Roseń, J. Semaniak, R. Thomas, M. af Ugglas, W. Zong, and M. Larsson, Phys. Rev. A 64, 012702 (2001).
8. N. Djurić, G.H. Dunn, A. Al-Khalili, A.M. Derkatch, A. Neau, S. Roseń, W. Shi, L. Vikor, W. Zong, M. Larsson, A. Le Padellec, H. Danared, and M. af Ugglas, Phys. Rev. A 64, 022713 (2001).
9. Z. Amitay, D. Zajfman, P. Forck, U. Hechtfischer, M. Grieser, D. Habs, D. Schwalm, and A. Wolf, in Applications of Accelerators in Research and Industry, edited by J.L. Duggan and I.L. Morgan (AIP Press, New York, 1997), p. 51.
10. P. Forck, Ph.D. thesis, Ruprecht-Karls-Universität Heidelberg, 1994 (unpublished).
11. N. Djurić, Y.-S. Chung, B. Wallbank, and G.H. Dunn, Phys. Rev. A 56, 2887 (1997).
12. R.K. Janev and D. Reiter, Phys. Plasmas 9, 4071 (2002).
13. M.E. Bannister, Phys. Rev. A 54, 1435 (1996).
14. D.C. Gregory, F.W. Meyer, A. Müller, and P. Defrance, Phys. Rev. A 34, 3657 (1986).
15. P.A. Schulz, D.C. Gregory, F.W. Meyer, and R.A. Phaneuf, J. Chem. Phys. 85, 3386 (1986).
16. F.W. Meyer, in Trapping Highly Charged Ions: Fundamentals and Applications, edited by J. Gillaspy (Nova Science, Huntington, NY, 2001), p. 117.
17. Z. Amitay, D. Zajfman, P. Forck, U. Hechtfischer, B. Seidel, M. Grieser, D. Habs, R. Repnow, D. Schwalm, and A. Wolf, Phys. Rev. A 54, 4032 (1996).
18. F.R. Ornellas and F.B.C. Machado, J. Chem. Phys. 84, 1296 (1986).
19. P.M. Mul, J.B.A. Mitchell, V.S. D'Angelo, P. Defrance, J.W. McGowan, and H.R. Froelich, J. Phys. B 14, 1353 (1981).
20. S. Green, P.S. Bagus, B. Liu, A.D. McLean, and M. Yoshimine, Phys. Rev. A 5, 1614 (1972).
21. I. Kusunoki, S. Sakai, S. Kato, and K. Morokuma, J. Chem. Phys. 72, 6813 (1980).
22. R.P. Saxon, K. Kirby, and B. Liu, J. Chem. Phys. 73, 1873 (1980).
23. R.P. Saxon and B. Liu, J. Chem. Phys. 78, 1344 (1983).
24. B. Levy, J. Ridard, and E. Le Coarer, Chem. Phys. 92, 295 (1985).
25. P.A. Taylor and G.H. Dunn, Phys. Rev. A 8, 2304 (1973).
26. P.A. Taylor, K.T. Dolder, W.E. Kauppila, and G.H. Dunn, Rev. Sci. Instrum. 45, 538 (1974).
27. D.S. Belić, R.A. Falk, G.H. Dunn, D. Gregory, C. Cisneros, and D.H. Crandall, Bull. Am. Phys. Soc. 27, 49 (1981).
28. M.F.A. Harrison, Br. J. Appl. Phys. 17, 371 (1966).
29. D.C. Gregory, P.F. Dittner, and D.H. Crandall, Phys. Rev. A 27, 724 (1983).
30. H. A. Enge, in Focusing of Charged Particles, edited by A. Septier (Academic Press, Orlando, 1967), Vol. II, Chap. 4.2, pp. 203-264.
31. SIMION 3D, Version 6.0, David Dahl, INEL-95/0403 (1995).
32. H.M. Rosenstock, K. Draxl, B.M. Steiner, and J.T. Herron, J. Phys. Chem. Ref. Data 6, 1 (1977).