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Volumn 79, Issue , 1999, Pages 64-66
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Polytype Inclusions and Triangular Stacking Faults in 4H-SiC Layers Grown by Sublimation Epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0347309302
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (5)
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References (9)
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